AI technique that significantly improves Atomic Force Microscopy

AI Breaks Fundamental Limitations of Atomic Force Microscopy

An artificial intelligence (AI) method developed by researchers at the University of Illinois Urbana-Champaign allows AFM to see material characteristics smaller than the tip of the probe, greatly enhancing AFM. This discovery might transform the field of material science and Nano electronics development by providing the first full three-dimensional profiles that go beyond traditional resolution limitations.

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